Read Electro-Thermal Simulation Studies of Sic Junction Diodes Containing Screw Dislocations Under High Reverse-Bias Operation - National Aeronautics and Space Administration | ePub Online

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The objective of this work was to conduct a modeling study of SiC P-N junction diodes operating under high reverse biased conditions. Analytical models and numerical simulation capabilities were to be developed for self-consistent electro-thermal analysis of the diode current-voltage (I-V) characteristics. Data from GRC indicate that screw dislocations are unavoidable in

Title : Electro-Thermal Simulation Studies of Sic Junction Diodes Containing Screw Dislocations Under High Reverse-Bias Operation
Author : National Aeronautics and Space Administration
Language : en
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Uploaded : Apr 11, 2021

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